Platform · Image Standardization

Flatfield correction and cross-instrument calibration

The image standardization module corrects systematic sources of intensity variability at the optical and detector level — before any segmentation or measurement runs on your data.

Image Standardization Module

Flatfield Correction

Corrects for non-uniform illumination across the field of view. Cytely estimates the flatfield function from reference images (slide blank, averaged sample images, or empirical background) and applies a per-pixel correction. Intensity at image edges, which is typically 15–25% lower than at center in widefield configurations, is restored to uniformity.

Background Subtraction

Removes autofluorescence and detector dark-current offset using configurable strategies: rolling-ball background estimation, blank-image reference, or channel-specific offset. Preserves signal-to-noise ratio in dim channels while preventing intensity inflation in bright-field contamination scenarios.

Cross-Instrument Normalization

Maps fluorescence intensity distributions from multiple acquisition systems to a common reference frame. Cytely uses fluorescent reference standards or shared sample anchors to derive per-channel gain correction factors — enabling direct comparison of measurements from different ZEISS, Leica, Nikon, or Olympus systems.

Protocol

Correction pipeline parameters

Each parameter set can be saved as a named protocol tied to a specific instrument configuration. Protocols are versioned and auditable.

ParameterOptionsDefault
flatfield_modereference, empirical, blindempirical
background_methodrolling_ball, blank_image, offset_constantrolling_ball
normalization_referencePath to reference standard image setNone
per_channeltrue, falsetrue
output_bit_depth16bit, 32bit_float16bit
clip_negativetrue, falsetrue

Questions about correction strategy?

The right flatfield mode depends on whether you have access to a blank slide reference or need to estimate the flatfield empirically. Our application scientists can advise based on your instrument configuration.